${\mathrm{Co}}_{2}\mathrm{FeAl}$ (CFA) thin films, of various thicknesses ($3\phantom{\rule{0.28em}{0ex}}\text{nm}\ensuremath{\le}t\ensuremath{\le}50\phantom{\rule{0.28em}{0ex}}\mathrm{nm}$), have been grown by sputtering on (001) MgO single-crystal substrates and annealed at different temperatures ($\text{RT}\ensuremath{\le}{T}_{a}\ensuremath{\le}600\phantom{\rule{0.16em}{0ex}}{}^{\ensuremath{\circ}}\mathrm{C}$, where RT is the room temperature). The influence of the CFA thickness ($t$), as well as ex situ annealing temperature (${T}_{a}$), on the magnetic and structural properties has been investigated by x-ray diffraction (XRD), vibrating sample magnetometry, and broadband microstrip ferromagnetic resonance (MS-FMR). The XRD revealed an epitaxial growth of the films with the cubic [001] CFA axis normal to the substrate plane and that the chemical order varies from the $B2$ phase to the $A2$ phase when decreasing $t$ or ${T}_{a}$. The deduced lattice parameters showed an in-plane tetragonal distortion and in-plane and out-plane strains that increase with ${T}_{a}$ and $1/t$. For all ${T}_{a}$ values, the variation of the effective magnetization, deduced from the fit of MS-FMR measurements, shows two different regimes separated by a critical thickness, which is ${T}_{a}$ dependent. It decreases (increases) linearly with the inverse thickness ($1/t$) in the first (second) regime due to the contribution of the magnetoelastic anisotropy to surface (to volume) anisotropy. The observed behavior has been analyzed through a model allowing for the separation of the magnetocrystalline, magnetoelastic, and N\'eel-type interface anisotropy constants to the surface and the volume anisotropies. Similar behavior has been observed for the effective fourfold anisotropy field which governs the in-plane anisotropy present in all the samples. Finally, the MS-FMR data also allow one to conclude that the gyromagnetic factor remains constant and that the exchange stiffness constant increases with ${T}_{a}$.
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