Abstract
We report on a systematic study of core level X-ray photoelectron spectroscopy (XPS) of clean and well characterized magnetite, Fe3O4, films on single crystalline Si (100) and MgO (100) oriented substrates. The films were grown using pulsed laser deposition at a substrate temperature of 450°C. X-ray diffraction (XRD) studies shows that the Fe3O4 films on Si (100) and MgO (100) possess (111) and (100) orientation respectively. The Fe 2p core level XPS spectra for the Fe3O4 films on MgO (100) and Si (100) shows different binding energies of the Fe2+ and Fe3+ cations depending on their site symmetry i.e. whether in octahedral or tetrahedral site in the spinel crystal structure. Observed difference between the core level Fe 2p spectra for the films are attributed to the difference in the strain present in the films.
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