Abstract
We report a multilens X-ray interferometer consisting of six parallel arrays of planar compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. Overlapping such coherent beams produces an interference pattern demonstrating substantially strong longitudinal functional dependence. The interference fringe pattern produced by multilens interferometer was described by Talbot imaging formalism. Theoretical analysis of the interference pattern formation was carried out and corresponding computer simulations were performed. The proposed multilens interferometer was experimentally tested at ID06 ESRF beamline in the X-ray energy range from 10 to 30 keV. The experimentally recorded fractional Talbot images are in a good agreement with computer simulations.
Highlights
Since their development, the use of X-ray refractive lenses has rapidly expanded to the extent that they are widely used on synchrotron beamlines [1,2,3,4,5,6]
The typical exposure time was 2 seconds during a 7/8 beam bunch mode (200 mA current). As it was mentioned earlier, the foci of the six lens arrays in the interferometer form a periodic structure and the foci are reproduced at the Talbot distances and are reproduced with a different scale in the fractional Talbot distances
The lens arrays in the interferometer were arranged in a “chessboard” pattern such that the compound refractive lenses (CRL) arrays are shifted relative to each other by the distance equal to half length of the individual single lens
Summary
The use of X-ray refractive lenses has rapidly expanded to the extent that they are widely used on synchrotron beamlines [1,2,3,4,5,6]. The use of tunable systems such as transfocators with a variable number of lenses, offers focal length tunability that drastically extends the applicability of refractive optics [7,8,9]. They can be adapted to very high X-ray energies by modifying composition and number of lenses, and refractive optics can be inserted and removed from the beam to allow fast switching of the beam size from the micrometer to nanometer scale. Using the intrinsic property of the refractive lens as a Fourier transformer, the coherent diffraction microscopy and high resolution diffraction methods have been proposed to study 3-D structures of semiconductor crystals and mesoscopic materials [12,13,14,15]
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