Abstract
The structural features of synthetic garnet, diamond, and sapphire single crystals are investigated via the nondestructive methods of double-crystal X-ray diffractometry and topography. The conditions of diffraction studies into these crystals performed with the help of Ge monochromators are optimized. The main structural defects (dislocations, stacking faults, growth striations, second-phase inclusions, etc.) of crystals arising from their generation are revealed. It is demonstrated that the experimental techniques for studying the real structure turn out to be highly efficient in optimizing crystal-growth technology.
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