X-ray attenuation coefficient measurements for photon energies 4.508?13.375keV in Cu, Cr and their compounds and the validity of the mixture rule

Abstract

To investigate the validity of the mixture rule which is used to compute the mass attenuation coefficients in compounds, the total mass attenuation coefficients for Cu, Cr elements and Cu 2 O, CuC 2 O 4 , CuCl 2 ·2H 2 O, Cu(C 2 H 3 O 2 ) 2 ·H 2 O, Cr 2 O 3 , Cr(NO 3 ) 3 , Cr 2 (SO 4 ) 3 ·H 2 O, Cr 3 (CH 3 CO 7 )(OH) 2 compounds were measured at photon energies between 4.508 and 13.375 keV by using the secondary excitation method. Ti, Mn, Fe, Ni, Zn, Ge, As, Rb elements were used as secondary exciters. 59.5 keV gamma rays emitted from an 241 Am annular source were used to excite the secondary exciters and Kα (K-L 3 , L 2 ) rays emitted from the secondary exciter were counted by a Si(Li) detector with a resolution of 160 eV at 5.9 keV. Our measurements indicate that the mixture rule is not a suitable method for the computation of mass attenuation coefficients of compounds especially at an energy that is near the absorption edge. Obtained values were compared with theoretical values.