Abstract
X-ray Photoelectron Spectroscopy (XPS) was used to study the influence of low energy Ar + ion bombardment, electron bombardment and Pt deposition on the SrTiO 3 (STO) single crystal electronic structure. Atomic composition changes were found and attributed to chemical reconstruction of the STO surface. A clear correlation between the presence of conducting, low Ti oxidation states in valence band and core level changes was detected. A strong effect caused by electron irradiation was ascribed to the electroreduction process. The influence of lanthanum doping on surface instability of STO was also discussed. The La doped sample (STO: 3,75% La) was found to be modified upon Pt metal deposition to a higher degree than pure STO crystal.
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