Abstract
AbstractSamples of the Bridgman‐grown nonlinear optic crystal of ZnGeP2 are studied using the methods of topography on a laboratory source and on a synchrotron radiation source. Methods of quasi‐plane‐wave topography, white beam topography, and rocking curve topography are used. Dislocation bundles, growth striations, small‐angle boundaries, and other defects are observed. The macroscopic distribution of defects in crystals and disorientations present in the crystal are studied. The mechanism of formation of images of growth striations is discussed. Digital analysis of the growth striations is carried out to characterize the growth process.
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