Abstract
The accuracy of PIXE analysis is enhanced by having available a complete characterization of the Si(Li) X-ray detector as regards both efficiency and resolution function (lineshape) in the 1–35 keV X-ray energy range. Work in both these areas is reviewed, and the dead-layer concept, together with its role in low-energy response, is critically examined. The potential of other spectrometer types including high-purity germanium detectors and diffraction spectrometers is briefly considered.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
