Abstract
Drop deposition is one of the techniques for the preparation of beta spectrometry samples. Its advantage is versatility and simplicity. On the contrary, the unsatisfactory repeatability of the sample quality is its drawback. The radioactive layer produced is not homogeneous, which causes the differences in absorption properties for low-energy beta radiation. This can be a problem in applications based on spectrum shape analysis, such as the determination of radionuclide impurities in pure beta emitter mixtures.The main objective of the paper is to investigate whether radioactive samples can be characterized in detail using X-ray fluorescence analysis. Furthermore, the application of this measurement for the accuracy improvement of beta spectra calculation in the MCNPX software package is demonstrated. Summing up the results obtained, it can be concluded that the high-resolution XRF 2D scanning of radiation sources can be used to reduce uncertainties in Monte Carlo simulations.
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