Abstract
We present studies of X-ray emission from aluminium under picosecond and femtosecond irradiation in the intensity range \(\) 1012-1015 W cm-2. We use a new and simple method to measure spectrally resolved absolute X-ray yields. It is shown that the X-ray yields can be obtained for arbitrary levels of X-ray flux. We present details of the variation of the absolute yields as a function of wavelength, intensity, polarization and pulse duration of the incident laser radiation. Electron temperatures in the keV range are observed at 1015 W cm-2 with femtosecond laser pulses.
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