X-ray diffraction analysis for main peaks and the noises of single and multi-walled carbon nanotubes

Abstract

The XRD for carbon nanotubes shows the main two peaks at 2Ө ≈ 25∘ and 43∘ with many noises for all the line from 5∘ to 80∘ which depend on nature of structure. The noises produce from instrumental sources and the physical properties of tubular structure and that represent by inter and intra Van Der Waals forces. Most of the noises were removed by using computerized programs while it is referred to nature of tubular structure with one or many sheets of graphene. The most of this noises represent the nature of structure which reduces with increase graphene sheets, thus removing it delete the specific proprieties of CNTs. The graphite behave the same properties of tubular structure which variant with number of sheets.