X-ray differential phase-contrast imaging simulations with Geant4

Abstract

The development of accurate simulation tools including x-ray phase-contrast effects is of great use in the design and optimization of x-ray phase-contrast imaging (XPCI) experimental setups. When the lateral coherence of the imaging system is limited, as in most compact laboratory-based XPCI applications, phase-contrast can be effectively described through refraction effects that can be simulated with a ray-tracing approach. This work presents a practical implementation of the x-ray phase-contrast in Geant4 and validates the simulation results against theoretical predictions for the propagation-based (PB) and edge-illumination (EI) imaging configurations. The simulation includes a realistic polychromatic tungsten anode spectrum and an extended x-ray source, a virtual phantom made of plastic wires with a diameter of 1 mm, as well as an accurate description of the absorbing masks and related movement during data acquisition. Results show a good agreement between theory and simulations, with maximum discrepancies below 2% in the intensity of PB images, below 0.3 µrad for EI refraction, and below 0.03 mm for EI projected thickness. Additionally, an often disregarded effect such as the refraction sensitivity inhomogeneity across the field of view (around 20%) was reproduced by the simulation and quantitatively explained through a theoretical model. The presented simulation platform will be extensively used for the design of a novel EI facility that is under construction at the INFN laboratories in Trieste (Italy) in the framework of the Photon-counting Edge-illumination Phase-contrast Imaging (PEPI) project.