Abstract
Polycrystalline diamond detectors with energy resolving capability of the impinging beam were realized and tested by using a miniature pyroelectric x-ray pulse generator. Microstrip structures were defined by photolithography aimed to reduce parasitic capacitances and to perform characterization measurements in a sandwich configuration. Leakage currents as low as 20pA at 500V were measured on a 270μm thick device. Pulse height distributions were carried out around TaLα (8.14keV) and CuKα (8.05keV) characteristic lines of the source. Energy resolution at 200V was found equal to 9% with an increase to 11% at 500 V. When the bias was increased to the maximum voltage the sample shows an Ohmic behavior.
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