Abstract
Luminescence properties of Mn doped MgAl2O4 crystals connected with the Si PIN photodiode (PD) have been evaluated for X-ray detector applications. Mn doped MgAl2O4 crystals emit green colored luminescence peaking at around λ = 520 nm with CuKα irradiation. The intensity of the output signal from Si PD increases linearly with the X-ray intensity of CuKα generated with the X-ray tube at a current from 2 mA to 40 mA. The intensity of the X-ray excited luminescence is strongest in the specimen with 3.0 mol. % Mn. Afterglow luminescence is weak in the specimen with 2.0 mol. % Mn. Mn doped MgAl2O4 crystals connected with the Si PD is considered to be a useful X-ray detector.
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