Abstract
In white-light interferometry the surface profile is determined by measuring the fringe contrast function of the white-light interferogram. One of the techniques proposed for the measurement of the fringe contrast function is the use of the phase shifting technique with the help of an achromatic phaseshifter. The available phase-shifters employ a rotating polarization component at the output end of the interferometer. Using a rotating polarization component at the input end, rather than at the output end, has certain advantages. In this paper we investigate a rotating half-wave plate phase-shifter at the input end for its applications to a white-light interferometer.
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