Abstract
Planar glass waveguides fabricated by diffusion of silver ions in soda-lime–silicate glass substrates have been characterized by measuring the wavelength dependence of propagation constants of the guided modes. The results are in good agreement with theoretical prediction obtained by an accurate WKB analysis using a complementary error function for the index profile. Cutoff wavelengths of higher-order modes are larger than were predicted by the analysis and are a result of higher attenuation encountered close to the cutoff.
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