Abstract
A black phosphorus photodetector is utilized to investigate the light-scattering patterns of a silicon waveguide through wavelength- and polarization-dependent scanning photocurrent measurements. The photocurrent signals exhibit similar patterns to the light-intensity distribution of the waveguide calculated by finite-difference time-domain simulations, suggesting that photoexcited electron-hole pairs in the silicon waveguide can be injected into phosphorene to induce its photoresponse.
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