Abstract
This paper reports very low light-reflection from the surface of incidence of a silicon solar cell. The measured hemispherical front surface light-reflectance of our epi thin film silicon solar cell is 1% over the optimum wavelength range 560 to 860 nm and below 2% in the range 440 to 960 nm. These reflectances are the lowest ever achieved for any silicon solar cell. The low reflection has resulted in a 7.9 mA/cm 2 higher current density and a 4.5% higher efficiency than those of our best thin film silicon solar cell prior to the optimisation described.
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