Abstract
A method of service life tests of SLD-37 quantum-well superluminescent diodes (SLDs), which are widely used in optical coherence tomography, is described and the results of tests are presented. Special attention is given to variations in the emission spectra of SLDs during their aging. It is shown that this method can be used as an incoming test to select processed semiconductor heterostructures with the longest expected lifetime for fabrication of active elements of SLD modules.
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