Abstract
The variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM). The results show that the Volta potential is not linear in the dislocation density. When the dislocation density increases due to the deformation of pure copper, the Volta potential tends to a physical limit. The Volta potential exhibits a fractional function relationship with the dislocation density only for a relatively low shape variable.
Highlights
Dislocations on the Volta Potential ofThe Volta potential, as measured by scanning Kelvin probe force microscopy (SKPFM), has proven to be a useful quantity for assessing the nobility of local microstructures of an alloy to improve the understanding of localized corrosion and galvanic activities [1–5]
Wen Li et al [32]. proposed a theoretical model for the change in the electron work function (EWF) induced by a single dislocation for conventional polycrystalline copper: briefly, the lattice distortion induced by a dislocation weakens the electrostatic binding between the nucleus and the outermost electron, which increases the electron Fermi level and decreases the value of the electron escape function in the dislocation region
Wen Li et al [32] proposed a theoretical model for the change in the EWF induced by a single dislocation for conventional polycrystalline copper: briefly, the lattice distortion induced by a dislocation weakens the electrostatic binding between the nucleus and the outermost electron, which increases the electron Fermi level and decreases the value of the electron escape function in the dislocation region
Summary
The Volta potential, as measured by scanning Kelvin probe force microscopy (SKPFM), has proven to be a useful quantity for assessing the (relative) nobility of local microstructures of an alloy to improve the understanding of localized corrosion and galvanic activities [1–5]. Considerable effort has been expended in studying the mechanical effects of forces, such as stress and deformation, on EWFs over the past few decades. The effect of deformation on the electronic nature of metals remains unclear and considerably complex [7]. Scanning Kelvin probe technology (SKP) has mainly been used to determine the EWF [8,9]. The effective spatial resolution of SKP is not sufficiently accurate to distinguish the potential difference between grains. The potential fluctuations measured by SKP are essentially averaged over dozens of grains. The EWF is sensitive to surface geometrical configurations [10], such as the surface roughness [11] and microcracks [12], which can be regarded as an interference factor in SKP measurement
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