Abstract
Very thin organic or polymer films can be analyzed using several analytic techniques. The thickness of the films discussed ranges from monolayers to several thousand ångströms. The techniques described are X-ray photoelectron spectroscopy, IR spectroscopy, ellipsometry and use of the quartz crystal oscillator microbalance. The last technique was applied to a fluoropolymer deposited onto a silver surface. The parameters which control film thickness and unformity are discussed along with how these parameters are measured. The second example discussed is the application of nitrogen-containing organic molecules to copper and iron surfaces. The chemical bonding is discussed along with the orientation of the molecules in the resulting film and the analytical techniques used.
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