Abstract
This paper analyses the effect of the variability of metrological characteristics of a set of low-cost Micro Electro-Mechanical Systems (MEMS) for the acceleration measurement, on the calculation of typical features used for condition monitoring (CM) of automatic production lines. The knowledge of the contribution of the variability of metrological characteristics to the final accuracy of features is an aspect of interest when networks of low-cost sensors are used, in particular in case the variability of their characteristics is high. In fact, due to a mass production, the calibration is not carried out sensor by sensor, but the characteristics are determined on a sample basis and assigned to the entire batch. Neglecting the variability between sensors can lead to effects on the results of data analysis, which are not easily predictable. In this paper, the real variability of the sensor's characteristics, experimentally evaluated through the calibration of a set of 25 low-cost MEMS accelerometers, has been taken into account. Digital sensitivity, signal-to-noise ratio and data rate variability of each device have been considered for the analysis. The analysis has been carried out with reference to two different test cases of industrial interest, by modifying the real outputs of high performance piezoelectric accelerometers used for CM, in order to simulate the effect of the metrological characteristics of MEMS sensors. The results show which features, among those typically used for CM, are more affected and which characteristics of MEMS are more influencing the features themselves, with reference to the specific considered applications.
Highlights
The most modern industrial realities are structured as systems of collaborating computational entities which are in intensive connection with each other and with the physical world
According to the previous considerations, the aim of this paper is to analyse the effect of the variability of metrological characteristics of a set of Mechanical Systems (MEMS)-based devices, on the calculation of typical features used in condition monitoring (CM)
This paper analyses the effect of the variability of metrological characteristics of a set of low-cost MEMS accelerometers, on the calculation of typical features used in CM of automatic production lines
Summary
The most modern industrial realities are structured as systems of collaborating computational entities which are in intensive connection with each other and with the physical world This kind of operations provides and uses, at the same time, large amount of data, with the aim at realizing totally or partially autonomous operations. If applications concerning improvement of energy efficiency, reliability and safety of assets are considered, autonomous tuning, diagnosis and prognosis of devices could be achieved [1,2,3] In this kind of industrial contexts, sensors and sensor networks cover a relevant role, because they must provide accurate quantitative information about physical processes which, allows people or smart devices to make suitable decisions.
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: International Journal of Metrology and Quality Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
