Abstract

As artificially engineered subwavelength periodic structures, terahertz (THz) metasurface devices exhibit an equivalent dielectric constant and dispersion relation akin to those of natural materials with specific THz absorption peaks, describable using the Lorentz model. Traditional verification methods typically involve testing structural arrays using reflected and transmitted optical paths. However, directly detecting the dielectric constant of individual units has remained a significant challenge. In this study, we employed a THz time-domain spectrometer-based scattering-type scanning near-field optical microscope (THz-TDS s-SNOM) to investigate the near-field nanoscale spectrum and resonant mode distribution of a single-metal double-gap split-ring resonator (DSRR) and rectangular antenna. The findings reveal that they exhibit a dispersion relation similar to that of natural materials in specific polarization directions, indicating that units of THz metasurface can be analogous to those of molecular structures in materials. This microscopic analysis of the dispersion relation of artificial structures offers new insights into the working mechanisms of THz metasurfaces.

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