Abstract
Abstract High-pressure X-Ray diffraction studies on terbium oxide have been carried out up to a pressure of ∼35 GPa in a diamond anvil cell at room temperature. Terbium oxide, which exhibits the fluorite structure at ambient conditions, remains stable in its fluorite form up to a pressure of ∼27 GPa. Above 27 GPa, it undergoes a structural phase transition accompanied with broadening and appearance of new diffraction peaks. The large structural stability of the compound under pressure is thus unusual when compared with other rare earth sesquioxides, and has been attributed to the presence of Tb4+ ions. The XPS spectra on the sample confirms the presence of Tb4+ ions. The bulk modulus and its pressure derivative of the parent phase are evaluated and reported.
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