Abstract
New electronic single board tester described here allows us to test and compare basic characteristics of new types of the avalanche photo diode (APD) (SiPMD, MCAPD, GAPD). It can measure the static and dynamic characteristics of the APD. We applied virtual periphery concept for very fast and simple way to measure the S/N resolution and own noise of the APD under investigation. The tester helps to define the main parameters of equivalent circuit of APD and using them for simulation. The tester can be useful for long time monitoring. New method for data analysis is suggested here.
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