Abstract
Four different on-chip power-rail electrostatic discharge (ESD) clamp circuits have been designed to investigate their susceptibility to electrical fast transient (EFT) test. From the experimental results, the feedback loop in two kinds of on-chip power-rail ESD clamp circuits provides the lock function to perform a latchup-like failure after the EFT test. The re-design solution will be developed to overcome this issue to meet the regulation of EFT/EMC test.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
