Abstract
Strontium ferrite (SrM) thin films were prepared by dc magnetron sputtering system on thermally oxidized silicon wafer (SiO 2/Si), single-crystal sapphire with (00 l) orientation and single-crystal MgO with (111) orientation and the effect of Au and Pt underlayers on morphology and magnetic properties was studied. Experimental results revealed that with the application of underlayers, the crystallization temperature of SrM was reduced. Strontium ferrite thin films with uniaxial anisotropy were formed on all substrate specimens. Comparison of the results obtained on all thin films indicated that the maximum saturation magnetization and coercivity in the perpendicular direction were 0.377 T and 0.382 MAm − 1 , respectively, for thin films with Au underlayer and SiO 2/Si substrate.
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