Uncertainty in PV Module Measurement—Part I: Calibration of Crystalline and Thin-Film Modules

Abstract

This paper presents recent progress in reducing the measurement uncertainty for crystalline silicon (c-Si) and thin-film PV modules. It describes the measurement procedure and the uncertainty analysis, as applied at the CalLab PV Modules, Fraunhofer ISE's laboratory for module measurements. The uncertainty analysis covers the complete calibration process in detail, including measurements, correction to standard testing conditions, and determination of electrical module parameters ( <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SC</sub> , <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MPP</sub> , <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OC</sub> , etc.) from the I-V curve. Differences between c-Si and thin-film modules are addressed, most importantly in terms of spectral mismatch factor and short timescale stability problems. The paper outlines the importance of a comprehensive quality assurance system in a calibration laboratory as a prerequisite for accurate measurements on a daily basis. Particular attention is paid to results from a series of measurements taken every three weeks over a three-year period and conducted as part of the quality assurance system. In conclusion, this paper introduces a best-case uncertainty for c-Si module calibration of 1.6% for <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MPP</sub> and 1.3% for <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SC</sub> . This represents the lowest reported uncertainty for full size module calibration in a laboratory so far. The presented uncertainty in <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MPP</sub> of cadmium telluride and single-junction amorphous silicon modules is 2.9% and 1.8%, respectively. All mentioned uncertainties are expanded uncertainties ( <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">k</i> = 2).