Abstract
This paper presents a study of ultrasonic guided wave sensing performance of poly (vinylidene fluoride–trifluoroethylene) P(VDF–TrFE) thin film sensors. P(VDF–TrFE) thin films show sensitivity to ultrasonic Lamb waves modes similar to conventional PZT wafers. We present a novel guided wave technique to estimate the piezoelectric coefficient e31 of a bonded thin film in situ over ultrasonic frequency band. The technique is very simple that involves the use of the response of thin film and a guided wave propagation model to determine the piezoelectric coefficient at room temperature of 24 °C. The P(VDF–TrFE) thin films show an average e31 values of around 0.0906 C/m2 at various frequencies (60–400 kHz). At various strain levels (0.01–0.02 μe) these films show a constant e31 of 0.0972 C/m2. The proposed technique is capable of characterizing the thin film sensors in a non-destructive way and in situ, which helps in their calibration procedure. The study also provides an important insight towards optimized frequency range and sensitivity of newly developed P(VDF–TrFE) thin film for ultrasonic applications.
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