Abstract
In this paper the factors affecting the information limit of transmission electron microscopes are described in a general framework. Separate information limits are given for the influence of chromatic aberration and beam convergence, for specimen drift and vibration and for the detection of the image with a limited number of resolved pixels. Their relative importance is discussed and constraints are derived relating all factors to the information limit as given by the chromatic aberration. By taking into account the brightness of the source and the noise explicitly, it has been possible to find optima for the exposure time and the convergence angle of the illumination, yielding the best information limit which can be achieved with a given microscope. The higher brightness of a field-emission gun improves the information limit because a smaller angle of beam convergence can be used, but also because the signal-to-noise ratio is improved.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
