Abstract
The use of a rotating analyzer ellipsometer is proposed to measure the spectral variation of the transverse Kerr magneto-optic effect. A low inductance coil is placed close to the sample in such a way that an alternating magnetic field is applied in the plane of the sample and perpendicular to the plane of incidence. First the quantities ψ and Δ are measured in the conventional way. For the magneto-optic effect the magnetization is varied at a high frequency. The analyzer and polarizer are fixed at specified angles while the magneto-optic signal is measured with a lock-in detector. The data are used to determine the real and imaginary parts of the magneto-optic coefficients and their relative sign. It is shown how to calculate from this measurement the value of the off-diagonal elements of the dielectric tensor.
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