Abstract
Methods of characterization of a storage ring's lattice have traditionally been intrusive to routine operations. More importantly, the lattice seen by particles can drift with the beam current due to collective effects. To circumvent this, we have developed a novel approach for dynamically characterizing a storage ring's lattice that is transparent to operations. Our approach adopts a dedicated filling pattern which has a short, separate diagnostic bunch train (DBT). Through the use of a bunch-by-bunch feedback system, the DBT can be selectively excited on demand. Gated functionality of a beam position monitor system is capable of collecting turn-by-turn data of the DBT, from which the lattice can then be characterized after excitation. As the DBT comprises only about one percent of the total operational bunches, the effects of its excitation are negligible to users. This approach allows us to localize the distributed quadrupolar wakefields generated in the storage ring vacuum chamber during beam accumulation. While effectively transparent to operations, our approach enables us to dynamically control the beta beat and phase beat, and unobtrusively optimize performance of the National Synchrotron Light Source-II accelerator during routine operations.
Highlights
For high brightness synchrotron light sources, it is essential to mitigate lattice distortion to optimize performance during routine operations
Unlike orbit drift, which can be directly monitored by beam position monitors (BPMs) and controlled by an orbit correction and/or feedback system, dynamic lattice characterization is more difficult to perform without interfering with operations
If one were to use the pinger pulse to perturb the beam of a long bunch train, each bunch would experience a different excitation depending on its arrival time
Summary
For high brightness synchrotron light sources, it is essential to mitigate lattice distortion to optimize performance during routine operations. If one were to use the pinger pulse to perturb the beam of a long bunch train, each bunch would experience a different excitation depending on its arrival time. Lattices seen by the beam at high operational current differ from ones at low current due to the wakefields generated in the vacuum chamber and the pinger excitation is not capable of generating valid data for a long bunch train. Our method introduces a more transparent technique for lattice characterization that utilizes a short diagnostic bunch train (DBT) developed at NSLS-II [15]. The method for transparent lattice characterization has been developed and demonstrated at NSLS-II, a state-ofthe-art third generation light source in operation at Brookhaven National Laboratory.
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