Abstract
The microstructure of thin films of YBa 2Cu 3O 7-x deposited on MgO substrates by a Metal Organic Chemical Vapour Deposition method has been analysed by transmission electron microscopy. Films are highly textured with the unit cell c-axis of the film perpendicular to the surface. Some of the films contain a proportion of a-axis oriented grains. In films containing a high proportion of this type of grains, cross-sectional observations show that the insertion of the grains in the matrix is likely associated with a nucleation-growth process. Images also show the presence in the c-oriented matrix of stacking faults perpendicular to c and allow to analyse relaxation of the thin layer at the film/substrate interface.
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