Abstract
The transition radiation from nonrelativistic electrons moving in periodical nanostructures is discussed in view of its application to surface and interface analysis and thickness measurements. The spectrum of this radiation is shown to deliver information on the investigated sample that is similar to that provided by conventional x-ray reflectivity methods. An analytical expression for the intensity of electromagnetic radiation from the electrons passing through the periodical multilayers has been derived. Numerical examples of radiation spectra are given for some typical sample models, and general conditions for the observation of these spectra with a background of bremsstrahlung are discussed.
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