Transient Hot Strip (THS) Method: Uncertainty Assessment

Abstract

The standard method for measuring thermal transport properties of dielectric solids such as ceramics and refractories is the transient hot wire (THW) technique. In its simplest arrangement, a thin wire is embedded between two sample halves, where it acts simultaneously as a resistive heat source and a thermometer. From its temperature signal, the thermal conductivity and the thermal diffusivity of the dielectric can be derived. Up to now, there is no uncertainty assessment for this technique strictly following the ISO Guide to the Expression of Uncertainty in Measurement. Here we analyze the ISO standard uncertainty of the THW technique in the same way as in a previous paper on the uncertainty of the closely related transient hot strip (THS) technique. The two papers provide a comprehensive comparison of the most important advantages and disadvantages of these two transient techniques. The results obtained here for the uncertainty (5.8% for the thermal conductivity and 30% for the thermal diffusivity) are nearly the same as those for the THS method. Experiments on a Pyrex standard-reference sample confirm the results.