Abstract

A two-dimensional (2D) detector was used to construct phase plate STEM (P-STEM) images. Phase-contrast can be enhanced by the electron intensity inside the hole region of a thin film phase plate. The electron intensity outside the hole region also provides a dark image contrast, which is inconsistent with the weak phase object approximation. We consider that both images have scattering effects that provide a dark contrast. Therefore, scattering contrast was derived by summing these two images, and scattering effects were subtracted from each image to display negative and positive phase contrast. The resultant images are consistent with the weak phase object approximation. These results propose separating scattering (electron amplitude) and phase-contrast (electron phase) using P-STEM, along with a two-dimensional electron detector.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.