Abstract
This paper deals with a new method for temporal resolved voltage contrast measurements of integrated circuits (IC) with nematic liquid crystals. It is shown that the rms-behaviour of the liquid crystal can be exploited to perform sampled voltage contrast measurements with high temporal resolution. The determination of suitable measurement parameters is treated in detail and discussed by examples. The temporal resolution is limited by the ratio of threshold voltage and rms-value of the applied signal as well as the electro-optical transfer characteristic. Under suitable conditions we can show an absolute temporal resolution of less than 20nsec.. This method leads to a direct timing analysis of digital states which is demonstrated by a simple circuit.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
