Abstract
The electromechanical behavior of poly(vinylidene fluoride-trifluoroethylene) [P(VDF-TrFE)] ferroelectric thin film was investigated using the three dimensional (3D) phase-field method. Various energetic contributions, including elastic, electrostatic, and domain wall energy were taken into account in the variational functional of the phase field model. Evolution of the microscopic domain structures of P (VDF-TrFE) polymer film was simulated. Effects of the in-plane residual stress, the film thickness and externally applied electric bias field on the electromechanical properties of the film were explored. The obtained numerical results showed that the macroscopic responses of the electric hysteresis loops are sensitive to the residual stress and electric bias field. It was also found that thickness has a great effect on the electric hysteresis loops and remanent polarization.
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