Abstract
An important factor affecting the biomechanical behavior of implant-supported reconstructions is the implant-abutment misfit.Objective:This study evaluated the misfit between Ti-Base abutments and implants by means of polyvinyl siloxane replica technique using microcomputed tomography (μCT).Methodology:Volumetric and linear (central and marginal) gaps of four Ti-base abutments (n=10/group): (i) Odontofix LTDA (OD), (ii) Singular Implants (SING), (iii) EFF Dental Components (EFF), and (iv) Control Group (S.I.N implants) compatible with an implant system (Strong SW, S.I.N Implants) were measured using μCT reconstructed polyvinyl siloxane replicas.Results:The results showed significantly lower volume gap for Control S.I.N (0.67±0.29 mm3) and SING (0.69±0.28 mm3) Ti-base abutments relative to OD (1.42±0.28 mm3) and EFF groups (1.04±0.28 mm3) (p<0.033), without significant difference between them (p=0.936). While gap values were homogenous in the central region, EFF presented a significantly higher marginal gap. Accordingly, the Control S.I.N and Singular Ti-base abutments showed improved volumetric and marginal fit relative to Odontofix and EFF.Conclusion:The method of manufacturing abutments influenced the misfit at the implant-abutment interface.
Highlights
The increasing use of intraoral scanning and CAD-CAM technologies has challenged conventional fabrication procedures for prostheses for their expedited and patient-centered preference that supports a complete digital workflow, especially in dental implantology.[1,2] Implant abutments that are tailored for CAD-CAM use, such as Ti-base, allow for digital design and milling of customized restorations to be extraorally cemented and screwed to the implant.[3]
An important factor affecting the survival of implant-supported reconstructions is the fit at the implant-abutment interface, given that the clamping forces of such surfaces are maximized and most stable when the smallest gaps are present
Forty external hexagon implants (4.1x10 mm, Strong SW; S.I.N implants) were divided into 4 groups according to Ti-base abutment company (n=10/ group): (i) OD (Odontofix LTDA, Ribeirão Preto, SP, Brazil), (ii) SING (Singular Implants, Parnamirim, RN, Brazil), (iii) EFF (EFF Dental Components, São Paulo, SP, Brazil), and (iv) Control Group (S.I.N implants, São Paulo, SP, Brazil)
Summary
The increasing use of intraoral scanning and CAD-CAM technologies has challenged conventional fabrication procedures for prostheses for their expedited and patient-centered preference that supports a complete digital workflow, especially in dental implantology.[1,2] Implant abutments that are tailored for CAD-CAM use, such as Ti-base, allow for digital design and milling of customized restorations to be extraorally cemented and screwed to the implant.[3]. The advantages of this technique include emergency profile customization, time efficiency with reduced costs, hybrid retention mechanism (cemented and screwed) that allows excess cement removal, and improved photocuring of the restoration margins prior to screwing.[4,5]. The postulated null hypothesis was that compatible Ti-base abutments would present similar gap at the implant-abutment interface compared to proprietary implant-abutment assemblies
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