Abstract
Resolving the 3D wave vector k in photoemission mapping of the band structure E( k ) requires knowledge of the unoccupied final states. Both dispersions and lifetimes of these states can be achieved by very-low-energy electron diffraction (VLEED). By incorporating the non-free-electron and excited-state effects in the final states, combining VLEED with photoemission provides accurate mapping of the valence E( k ) resolved in the 3D wave vector and under control of the intrinsic accuracy. We here concentrate on the most accurate combined method which uses angle-dependent VLEED and photoemission measurements. It provides access to many Brillouin-zone lines using one crystal surface, and benefits from an intensity gain and a better intrinsic accuracy near the Fermi level.
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