Abstract
Abstract Using indentation techniques the micro-deformation of freely suspended, thin, evaporated films has been studied in slow loading and impact situations. The films were mounted on electron microscope grids and loads were applied in the unsupported regions between the grid bars. For the slow loading studies, measured loads were applied with the tip of a tungsten stylus, and impact was achieved by projecting small spherical particles against the specimens. Polycrystal and single-crystal silver films were studied; indentation shape and size effects were recorded for deformation under controlled loading conditions. It is suggested that the indentation method could be useful for rapidly comparing the strength properties of thin films.
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