Abstract
Abstract Thin solid films of CeO 2 -SiO 2 , used as a counter-electrode layer in electrochromic devices, were prepared by the sol–gel dip coating, using an aqueous-based process. The influence of the SiO 2 addition on electrochemistry of the CeO 2 oxide coatings was determined by chronoamperometric measurements. The films exhibit a larger charge storage capacity, which was determined as a function of the coatings thickness. The peak occurrence in the chronoamperometric curve during the deintercalation of lithium ions in the cerium/silicon films is analyzed in terms of trapping energy levels for Li + ions into the film. In situ UV–Vis spectroelectrochemical measurements of the CeO 2 -SiO 2 coatings indicated that the films remained transparent in the visible spectral range during the intercalation process. Powders were characterized by X-ray diffraction after the same thermal treatment of the films, indicating a decrease of crystallinity with the doping. The feasibility for use of these electrodes as ion storage for electrochromic devices was investigated.
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