Abstract
The thin films (FePt)100−xAlx (x=0–8.5) with a thickness ranging from 10 to 100nm were deposited on quartz substrates by RF sputtering. The ternary samples were annealed at a high temperature of 800°C. For the sample thicker than 40nm, the coercivities Hc and magnetization values Ms of the samples were slightly decreased with increasing Al concentrations. A suppression of FCT phase transformation was observed as Al atoms dissolved into the FePt lattice. This can partially explain the decrease in Hc. However, as the film thickness was reduced to 10–20nm, the Hc values of the Al alloyed films were significantly enhanced. A maximum coercivity of 5.0kOe was observed in the high-aluminum sample (x=6.2) with a thickness of only 10nm, compared with the Hc value of 0.6kOe for the binary FePt film. The alloy addition of Al might offer heterogeneous nucleation sites for the Ll0 phase and enhanced the ordering transformation in the very thin films.
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