Abstract
We have studied the thickness dependence of the magnetic and transport properties of thin EuO films in the range of 10–60 Å. The ferromagnetic phase transition shows a systematic dependence of the critical temperature Tc with decreasing EuO film thickness. This behavior has been attributed to the interface layers which play a major role by reducing the number of average magnetic neighbors; we find the effect of interface intermixing becoming relevant in low thickness regime. In addition, we could identify a clear dependence of the onset of the metal-to-insulator transition on the ferromagnetic ordering of thin EuO films.
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