Abstract

Integrated Hall plates show self-induced offset due to the current flow in their current leads. The magnetic field surrounding these current leads generates a magnetic offset signal, while their resistive heating causes thermoelectric offset voltages. This paper reports experimental results on these two effects. They are obtained using a novel test structure enabling to separate the two contributions. In addition, the experimental results concerning the thermal behavior of the test structure are compared with finite element (FE) simulations.

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