Abstract
The microstructures of Fe 2Si 5 based alloys fabricated by spark plasma sintering and the subsequent heat treatment were investigated by X-ray diffraction (XRD) analysis and scanning electron microscope (SEM). The results showed that a two-phase structure consisting of β-FeSi 2 and Si dispersoids was obtained by the eutectoid decomposition of α-Fe 2Si 5 phase during annealing. The thermoelectric properties of Fe 2Si 5 based alloys were also investigated as compared with the stoichiometric FeSi 2 based alloys. It was found that Fe 2Si 5 based alloys have the same conduction mechanism with stoichiometric FeSi 2 alloys doped with Mn and Co, respectively. An increase in carrier scattering caused by Si particles was observed in both Mn- and Co-doped alloys. The effect of Si dispersoids on Seebeck coefficient and electrical resistivity was discussed. Results show that the excessive Si dispersoids in Fe 2Si 5 based alloys could improve the transport properties of the material, especially for the Co-doped alloys.
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