Abstract
A theoretical study on the role of bound electron in the process of backward secondary electron emission for He + incident on Al, Cu and C has been made. A Monte-Carlo computer code based on the theoretical model for the simulation of this phenomenon has been developed. The code can be used to calculate the yield, distribution statistics and other physical parameters of emitted electrons. The calculated results are compared with experimental data of other authors, and a good agreement is found. We also calculated the yield for He + incident on Al and Cu at the energy near the electronic stopping power maximum.
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