Abstract
When a dc arc is used for trace analysis on a spectrometer, calibration curves with a pronounced toe due to spectral background are found. For analysis of high purity materials it is most important that linear relationships should be established to ultra-trace levels when total impurity content is specified within the ppm level. A solution to this problem is outlined and the linear relationships obtained for copper, bismuth, and cadmium in high purity silver to 0.1 ppm are shown. An electronic circuit is described that enables these background corrections to be made.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
