Abstract
Scanners for Scanning Probe Microscopes (SPM) are generally built of piezos, which are used to move the sample with respect to the tip in x-, y- or z-direction or vice versa. These piezoelectric scanners are usually calibrated by the manufacturer with laser interferometry, with a calibration grid or with the crystallographic or artificial step of a known height standard. However, the displacement depends on the voltage history of the piezoelectric device. In order to avoid this effect for the x- and y-positions, SPM data are generally collected in one lateral direction to minimize the divergence between commanded position and true position. The aim of this work is to present the usefulness of a cheap and easy-to-use fibre optic displacement sensor. The sensor can be used to measure static and dynamic displacement of a z-piezo in order to find a calibration procedure or at least an error look-up table for open-loop systems. The collected data of two different piezo scanner types can be used to characterize their nonlinearity and hysteresis.
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