Abstract
Symmetric second and third order twin boundaries in silicon have been observed using high resolution TEM. Micrographs of a symmetric (221)..sigma.. = 9 boundary exhibited contrast feature consistent with the zig-zag dislocation structure proposed by Hornstra and similar to those reported in germanium. A model for a symmetric (529)..sigma.. = 27 boundary was constructed and found to have the same periodicity and faceted structure as an experimentally observed ..sigma.. = 27 boundary. A system for modelling the structure of tilt boundaries in tetrahedrally coordinated materials was developed based on the early work of Hornstra. Boundaries with (110) median planes and misorientations up to 70.53/sup 0/ were constructed using a repeating series of simple structural units.
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